Larin, Frank: Radiation Effects in Semiconductor Devices

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Larin, Frank : Radiation Effects in Semiconductor Devices

John Wiley & Sons, 1968

Book is in excellent condition. Binding is solid and square, covers have sharp corners, exterior shows no blemishes, text/interior is clean and free of marking of any kind. Dust jacket is slightly worn. 276 pages, contents include: low injection diode characteristics, low injection transistor characteristics, nuclear radiation, displacemnt effects in silicon devices, Transient damage effects in silicn devices, Surface damage effects "..."measurements for physical characteristics and equivalent circuit parameters... etc.. Physics. Book Condition: Fine. Binding: Hard Cover. Jacket: Good

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